SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION BY DIETER K.SCHRODER PDF

SEMICONDUCTOR. MATERIAL AND DEVICE. CHARACTERIZATION. Third Edition. DIETER K. SCHRODER. Arizona State University. Tempe, AZ. A JOHN. Library of Congress Cataloging-in-Publication Data: Schroder, Dieter K. Semiconductor material and device characterization / by Dieter K. Schroder. p. cm. 10 Feb Dieter K. Schroder Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques.

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Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. Chapter 3 Contact Resistance and Schottky Barriers. Venezuela Section Snippet view – Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding: Request permission to reuse content from this site.

This chapter also dieterr probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.

Semiconductor Material and Device Characterization, 3rd Edition

Would you like to change to the site? Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remainsessential reading for graduate students as well as forprofessionals working in the field of semiconductor devices andmaterials.

Institute of Electrical and Electronics Engineers. Reliability and Failure Analysis examines failure times anddistribution functions, and discusses electromigration, hotcarriers, gate oxide integrity, negative bias temperatureinstability, characterizarion leakage current, and electrostaticdischarge.

Appendix 2 Abbreviations and Acronyms. Updated and revised figures and examples reflecting the mostcurrent data and information new references offering access to the latest research anddiscussions in specialized topics New problems and devicf questions at the end of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

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Semiconductor material and device characterization – Dieter K. Schroder – Google Books

Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding:. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide ny, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Coverage includesthe full range of electrical dieetr optical characterization methods,including the more specialized chemical and physical techniques.

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Semiconductor Material and Device Characterization

Chapter 10 Optical Characterization. Readers familiar with the previous two editions will discover a thoroughly semiconuctor and updated Third Editionincluding:. Charge-Based and Probe Characterization introduces charge-basedmeasurement and Kelvin probes. Written by the main authority in the field of semiconductor characterization.

Added to Your Shopping Cart. An Instructor’s Manual presenting detailed solutions to all the problems charafterization the book is available from the Wiley editorial department.

References to this book High Temperature Electronics F. You are currently using the site but have requested a page in the site.

Semiconductor Material and Device Characterization, 3rd Edition

Updated and revised figures and examples reflecting the most current data and information new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers’ understanding of the material L.schroder addition, readers will find fully updated and revised sections in each chapter.

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My library Help Advanced Book Search. Chapter 11 Chemical and Physical Characterization. Plus, two new chapters have been added: Semiconductor Material and Device Characterization remains the sole chaeacterization dedicated to characterization techniques for measuring semiconductor materials and devices.

Selected pages Page 6. Permissions Request permission to reuse content from this site.

Semiconductor Material and Device Characterization. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques formeasuring semiconductor materials and devices.

Chapter 7 Carrier Lifetimes. Plus, two new chapters have been added: An Instructor’s Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. Schroder Snippet view – The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools k.schrover assist readers.